Conventional contact microscopy (AFM)
Polymer surface imaging: atomic force microscopy
Article REF: AM3280 V1
Conventional contact microscopy (AFM)
Polymer surface imaging: atomic force microscopy

Author : Ghislaine COULON

Publication date: January 10, 2000 | Lire en français

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2. Conventional contact microscopy (AFM)

For the sake of clarity, the operating principle of the atomic force microscope will be developed here in the case of the contact-mode atomic force microscope, developed by Binnig, Quate and Gerber in 1986. Later versions of the atomic force microscope will then be described more briefly, with application examples.

.AFM surface normal force measurement
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