Microscopy in non-contact (or resonant) mode
Polymer surface imaging: atomic force microscopy
Article REF: AM3280 V1
Microscopy in non-contact (or resonant) mode
Polymer surface imaging: atomic force microscopy

Author : Ghislaine COULON

Publication date: January 10, 2000 | Lire en français

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4. Microscopy in non-contact (or resonant) mode

To avoid tip-surface friction and image the surface of fragile materials, the resonant (non-contact) microscope was developed at virtually the same time as the "classic" contact-mode atomic force microscope [11] . In this case, the tip is located close to the surface, at a distance of the order of 10-100 nm, and is therefore sensitive to longer-range interaction forces of the attractive van der Waals, electrostatic or magnetic type.

Instead of measuring static spring deflections, as in the contact mode (AFM), the spring is forced to oscillate at a frequency close to its natural frequency, with a low amplitude (a few nanometers). In the presence of the interaction force, or more precisely the force gradient, dF/dz, the spring's effective stiffness constant...

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