Intermittent microscopy (TM)
Polymer surface imaging: atomic force microscopy
Article REF: AM3280 V1
Intermittent microscopy (TM)
Polymer surface imaging: atomic force microscopy

Author : Ghislaine COULON

Publication date: January 10, 2000 | Lire en français

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5. Intermittent microscopy (TM)

In the field of polymers, the advent in 1995 of the TM intermittent mode microscope (or Tapping TM mode) has significantly increased the resolution of surface images of non-model polymers (with, for example, high surface roughness).

An oscillation of high frequency (300 kHz), close to the spring resonance frequency (high stiffness: k = 10 -40 N/m; quality factor Q = 100 to 1,000) and variable amplitude (A i = 10 to 100 nm), is imposed on the spring [13] . Initially, the tip is far from the surface and the spring oscillates freely (amplitude A 0 ). Then, when the surface is brought closer to the polymer, the tip, for each low position,...

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