2. Applications of Auger spectromicroscopy
It is reasonable to assume that, with the help of ultra-high vacuum technology, surface science was born from the implementation of slow electron diffraction and Auger spectroscopy techniques in a single instrument. Indeed, as early as the 1960s and 1970s, using the instrument shown in [ ] (Figure 7 a), it was possible to simultaneously obtain the surface crystallography (regular distribution of atoms on the faces of a single crystal) and the basic chemical nature of the foreign species that could be deposited there either as a result of heat...
The Ultimate Scientific and Technical Reference
This article is included in
Analysis and Characterization
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Applications of Auger spectromicroscopy
Specificity and prospects of Auger spectromicroscopy
Bibliography
References
Standardization
- Analyse chimique des surfaces - Comité technique ISO/TC 201 -
- Chemical analysis of surfaces – Thickness profiling by bombardment – Optimization using single- or multi-layer systems as reference materials - ISO 14606:2000 - 10-00
- Chemical analysis of surfaces – Information protocols - ISO 14975:2000 - 12-00
- Chemical analysis of surfaces – Protocol for data transfer - ISO 14976:1998 - 7-98
- Chemical...
Databases and software
See also the manufacturers' websites.
Surface and Nano-analysis Basics, NPL
http://www.npl.co.uk/nanoanalysis/surfanalbasics.html#aes
NPL Auger Electron Spectrometer Intensity Calibration Software
Organizations
Versailles Project on Advanced Materials and Standards (VAMAS)
ASTM International, Surface and Analysis (Committee 42)
National Institute of Standards and Technology (NIST), Surface and Microanalysis...
Manufacturers, builders
(non-exhaustive list)
There are a significant number of accessory manufacturers (electron and ion guns, analyzers, UV chambers, etc.) that are not mentioned here. The same applies to companies supplying ESCA, mixed ESCA-Auger, or LEED-Auger spectroscopy equipment (and not specifically Auger-SAM). The following list is therefore not exhaustive.
JEOL
The Ultimate Scientific and Technical Reference
