3. Specificity and prospects of Auger spectromicroscopy
The examples of applications mentioned above have highlighted the importance of analyzing surfaces and interfaces, focusing primarily, but not exclusively, on the role of Auger spectromicroscopy. In the following, the specificity of this technique is clarified in order to identify its areas of excellence and future prospects.
3.1 Comparison with other techniques
Auger spectromicroscopy shares a number of similarities with other techniques, but also has specific differences.
Scanning electron microscopy (SEM) and X-ray microanalysis: we observed ([ ] § 2.1) that the architecture of Auger devices also allowed for the prior acquisition of secondary electron images comparable to those obtained with...
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Specificity and prospects of Auger spectromicroscopy
Bibliography
References
Standardization
- Analyse chimique des surfaces - Comité technique ISO/TC 201 -
- Chemical analysis of surfaces – Thickness profiling by bombardment – Optimization using single- or multi-layer systems as reference materials - ISO 14606:2000 - 10-00
- Chemical analysis of surfaces – Information protocols - ISO 14975:2000 - 12-00
- Chemical analysis of surfaces – Protocol for data transfer - ISO 14976:1998 - 7-98
- Chemical...
Databases and software
See also the manufacturers' websites.
Surface and Nano-analysis Basics, NPL
http://www.npl.co.uk/nanoanalysis/surfanalbasics.html#aes
NPL Auger Electron Spectrometer Intensity Calibration Software
Organizations
Versailles Project on Advanced Materials and Standards (VAMAS)
ASTM International, Surface and Analysis (Committee 42)
National Institute of Standards and Technology (NIST), Surface and Microanalysis...
Manufacturers, builders
(non-exhaustive list)
There are a significant number of accessory manufacturers (electron and ion guns, analyzers, UV chambers, etc.) that are not mentioned here. The same applies to companies supplying ESCA, mixed ESCA-Auger, or LEED-Auger spectroscopy equipment (and not specifically Auger-SAM). The following list is therefore not exhaustive.
JEOL
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