Methods for global fitting of the diffractogram
Characterization of polycrystalline materials by X-Ray Diffraction

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Methods for global fitting of the diffractogram


Characterization of polycrystalline materials by X-Ray Diffraction

Authors : Sandrine TUSSEAU-NENEZ, Sophie NOWAK

Publication date: April 10, 2026 | Lire en français

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8. Methods for global fitting of the diffractogram

Peak-by-peak methods (§ 7 ) can only be applied to pure phases or to mixtures where there is no overlap of lines, which limits their use. These methods consider only a few peaks in the diffractogram, which can lead to errors. In other cases, a global fit of the diffractogram is required. The basic concepts are based...

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