Other data obtainable by X-ray powder diffraction
Characterization of polycrystalline materials by X-Ray Diffraction

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Other data obtainable by X-ray powder diffraction


Characterization of polycrystalline materials by X-Ray Diffraction

Authors : Sandrine TUSSEAU-NENEZ, Sophie NOWAK

Publication date: April 10, 2026 | Lire en français

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7. Other data obtainable by X-ray powder diffraction

This section details the data that can be extracted from a diffractogram using peak-by-peak fitting methods, in which either some or all of the peaks are fitted. These methods contrast with the global diffractogram fitting methods described in § 8 . It is assumed that phase identification has already been performed....

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