Instrumentation
Charged particle-induced X-ray emission (PIXE): applications

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P2558 V3 Article

Instrumentation


Charged particle-induced X-ray emission (PIXE): applications

Authors : Philippe MORETTO, Lucile BECK

Publication date: March 10, 2004 | Lire en français

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1. Instrumentation

Ion beam analysis methods are based on the use of low-energy charged particle gas pedals. These small gas pedals produce light ions ( 1 H + , 2 D + , 3 He + , 4 He + ...) accelerated to energies of between 250 keV and 5 MeV. The interaction between the ions and the target to be analyzed generally takes place in a vacuum analysis chamber, although some devices allow analysis in air. The emitted X-rays are then detected and analyzed according to the principles of conventional X-ray spectrometry [109]...

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