Conclusion

Component EMC was first developed in response to the growing need to characterize and compare the EMC performance of integrated circuits. Several methods have been standardized for emission, immunity and pulses, and continue to evolve to keep pace with changing technologies (frequency range of the circuits themselves, and frequency range of the EMC requirements of industrial sectors). Since the 2000s, the modeling aspects of these circuits have also been addressed, and are beginning to be the subject of international standards. The first standards for modelling conducted emission are already available, and several current projects should lead to standards by 2016 (radiated emission and conducted immunity). These models are an obvious response to the need for manufacturers to predict and anticipate the EMC risks associated with integrating these components into their products. In the coming...