Phase analysis
Secondary ion mass spectrometry: SIMS and ToF-SIMS Analytical procedures and performances
Article REF: P2619 V2
Phase analysis
Secondary ion mass spectrometry: SIMS and ToF-SIMS Analytical procedures and performances

Authors : Evelyne DARQUE-CERETTI, Marc AUCOUTURIER, Patrice LEHUÉDÉ

Publication date: March 10, 2015 | Lire en français

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

6. Phase analysis

Variations in the ionization yields of species depending on the chemical nature of the phases in which they are found (matrix effect), which are a handicap for quantitative exploitation in elemental analysis, can on the contrary be a powerful means of identifying and measuring the quantities of phases in a material.

Figure 18 shows how differences in emissivity can be used to quantitatively measure changes in the precipitation of a compound in a material, here NbC in a steel . We first calibrate...

You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?


Article included in this offer

"Analysis and Characterization"

( 256 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details