2. Comparison sequence
The comparison was led by LNE as part of the Club nanoMétrologie ("Instrumentation" technical group) and took place in 2014 and 2015.
As this comparison involved a large number of participants (26 in all), it was decided to circulate two batches of samples, each comprising a P900H60 network and a VLSI standard. A back-up batch was also provided in case of package loss or network damage during the comparison.
Figure 4 explains how the comparison is organized in three stages:
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Comparison sequence
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Bibliography
- (1) - SEPPÄ (J.), KORPELAINEN (V.), BERGSTRAND (S.), KARLSSON (H.), LILLEPEA (L.), LASSILA (A.) - Intercomparison of lateral scales of scanning electron microscopes and atomic force microscopes in research institutes in Northern Europe. - Meas. Sci. Technol., vol. 25, n° 4, DOI: 10.1088/0957-0233/25/4/044013 (2014).
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