Protocols
Comparison of grating size measurements for AFM and SEM calibration
Article REF: R6741 V1
Protocols
Comparison of grating size measurements for AFM and SEM calibration

Authors : Alexandra DELVALLÉE, Sébastien DUCOURTIEUX

Publication date: December 10, 2022 | Lire en français

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3. Protocols

3.1 Two-phase protocol

The comparison was carried out in several stages for the participant (figure 5 ). The first step was to measure the two networks (P900H60 and VLSI) to determine their dimensional characteristics.

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