Description of samples
Comparison of grating size measurements for AFM and SEM calibration
Article REF: R6741 V1
Description of samples
Comparison of grating size measurements for AFM and SEM calibration

Authors : Alexandra DELVALLÉE, Sébastien DUCOURTIEUX

Publication date: December 10, 2022 | Lire en français

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1. Description of samples

For this comparison, two types of periodic array were released by the Club nanoMétrologie. The first was a 2D grating, developed in partnership with the Centre de Nanosciences et de Nanotechnologies (C2N, CNRS / Université de Paris Saclay), whose dimensional properties were unknown (step height and grating pitch). This structure is referred to in the following as "P900H60". The second structure was a VLSI Standards® grating with a calibration certificate for grating pitch and step height. It was supplied by Kummer Semiconductor Technology*.

Note :

*In 2014, this company was called JP Kummer.

1.1 Networks P900H60

P900H60 gratings were etched on a silicon wafer. Their grating pitches and...

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