7. Glossary
Nanoscale; Nanoscale
Scale conventionally from 1 nm to 100 nm.
Scanning electron microscopy (SEM) ;Microscope électronique à balayage (MEB)
Electron microscopy technique for obtaining high-resolution images of the sample surface using electron/matter interaction.
Atomic force microscopy (AFM) ;Microscope à force atomique (AFM)
Microscopy technique for obtaining images of a sample's topography by scanning a sharp tip over its surface.
Métrologie ; Metrology
Measurement science defining methods for ensuring confidence in measurement processes.
Measurement uncertainty
Dispersion of values assigned to a measurand based on the information used.
Calibration...
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Bibliography
- (1) - SEPPÄ (J.), KORPELAINEN (V.), BERGSTRAND (S.), KARLSSON (H.), LILLEPEA (L.), LASSILA (A.) - Intercomparison of lateral scales of scanning electron microscopes and atomic force microscopes in research institutes in Northern Europe. - Meas. Sci. Technol., vol. 25, n° 4, DOI: 10.1088/0957-0233/25/4/044013 (2014).
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