Background noise in the most common devices

Here we present low-frequency (LF) noise measurements used as a characterization tool for microelectronics: passive and active, discrete and integrated components. Low-frequency noise reflects current or voltage fluctuations in components. Using physical and electrical models, sources of minimal noise (white noise) and sources of excess noise (1/f noise, generation-recombination noise, RTS noise) are analyzed to study their influence on the operation of components and associated systems. In addition, given the sensitivity of these measurements, the amplitude and location of excess noise are used as a "technological indicator". In this way, the influence of certain process steps can be finely characterized (metallization, interface cleaning, etc.). Today, with the reduction in component size, the influence of LF noise on components and associated technologies is becoming increasingly important...