Background noise and measurements — Measurement and design applications

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Background noise and measurements — Measurement and design applications

Authors : Matteo VALENZA, Fabien PASCAL, Alain HOFFMANN

Publication date: December 10, 2006 | Lire en français

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AUTHORS

  • Matteo VALENZA : Professor at the University of Montpellier II

  • Fabien PASCAL : Professor at the University of Montpellier II

  • Alain HOFFMANN : Professor at the University of Montpellier II

 INTRODUCTION

This text should be read in conjunction with the dossier . Four objectives are developed in these files.

The first objective is the subject of the .

The second objective is to present the background noise that attaches to the main basic electronic components, both passive and active: resistors and sensors, different types of transistors and linear integrated circuits 1 ;

The third objective is to raise awareness of the various methods of measuring background noise and the accuracy of the measurements involved (§ 2 , § 3 );

Last but not least, the purpose of these files is to make the reader fully aware of the importance of background noise in measurement techniques, and the importance of mastering its knowledge in the components and circuits used or chosen when designing low-noise electronic circuits 4

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