2. Testing operational amplifiers and comparators
Like other semiconductors, operational amplifiers and comparators are defined by their static, functional and dynamic parameters (table ).
The measurement device shown in figure is dedicated to measuring the open-loop gain of AOP. In fact, if the gain of the measuring amplifier (Ampli) is greater than a few 10 5 the "+" and " – " inputs are at the same potential (to within a few μV). Then :
For PDO :
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Testing operational amplifiers and comparators
Measurement of 1 dB compression point and 3rd-order intercept point
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