1. Discrete active components

These components are measured in two ways:

• so-called "static" measurements are used to record or test their current-voltage characteristic (for diodes) or current-voltage as a function of base current (for bipolar transistors);

• dynamic measurements: these concern the "small signal" parameters of these devices, such as dynamic resistance, transconductances, h-parameters, S-parameters (see article [R 1 078v2] ).