Article | REF: R1080 V3

Measurements of electronical components - Part 3 : measurements of active components

Authors: Patrick POULICHET, Gilles AMENDOLA, Christophe DELABIE, Yves BLANCHARD

Publication date: June 10, 2009 | Lire en français

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    2. Testing operational amplifiers and comparators

    Like other semiconductors, operational amplifiers and comparators are defined by their static, functional and dynamic parameters (table ).

    The measurement device shown in figure is dedicated to measuring the open-loop gain of AOP. In fact, if the gain of the measuring amplifier (Ampli) is greater than a few 10 5 the "+" and " – " inputs are at the same potential (to within a few μV). Then :

    V1=Vdc

    For PDO :

    V+=V2R1R1+R2etV=0

    ...

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