Analysis of stratified samples
Electron probe X-ray microanalysis - Applications and developments
Article REF: P886 V1
Analysis of stratified samples
Electron probe X-ray microanalysis - Applications and developments

Author : Jacky RUSTE

Publication date: June 10, 2009 | Lire en français

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

5. Analysis of stratified samples

While conventional quantification procedures require a homogeneous sample in the analysis volume, f ( ρz ) models make it possible to analyze stratified samples, i.e. a succession of thin layers of constant thickness, with a total thickness of no more than a few microns.

For a layer buried between depths ρz i and ρz i+1 containing element A, we can, by definition of f (ρz ), write that the characteristic emergent intensity of the element under consideration coming from layer i is equal to :

Ifilm i=CACte j=i1j=1exp[(χAiχAj)Δρzj]ρzi+1ρziϕA(ρz)exp[χAiρz]dρz
You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?


Article included in this offer

"Analysis and Characterization"

( 256 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details