X mapping
Electron probe X-ray microanalysis - Applications and developments
Article REF: P886 V1
X mapping
Electron probe X-ray microanalysis - Applications and developments

Author : Jacky RUSTE

Publication date: June 10, 2009 | Lire en français

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3. X mapping

3.1 Digital cartography

By scanning the surface of the sample, either electronically in EDS spectrometry, or mechanically in WDS spectrometry, we can obtain an X map (or "X image") representative of the distribution of the element analyzed. This is illustrated by figure 8 , which shows the distribution of niobium and silicon in the solidification structure of an alloy steel. This information is generally purely qualitative.

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