Time-Frequency instrumentation — High frequencies and phase noise measurement

The first section [R 686] presents the principles of counting and the basic counters used in the time domain. Techniques for improving resolution to obtain more accurate measuring devices are covered in a second dossier [R 687] .

In this issue [R 688], we focus on meters operating at frequencies above 300 MHz, and on phase noise measurements.

Having reviewed the various meter principles, it's time to add a few details about microwave meters. Indeed, the limitations of electronic components require different techniques to bring microwave frequency measurements back into the usual range. These are described in our first paragraph.

Time-frequency duality means that it can be interesting to characterize a signal not in the time domain, but in the frequency domain. The various techniques are discussed in the second paragraph.

Today, there are very compact, high-performance digital devices that can perform both characterizations. This is the subject of our last paragraph.