3. X mapping
3.1 Digital cartography
By scanning the surface of the sample, either electronically in EDS spectrometry, or mechanically in WDS spectrometry, we can obtain an X map (or "X image") representative of the distribution of the element analyzed. This is illustrated by figure 8 , which shows the distribution of niobium and silicon in the solidification structure of an alloy steel. This information is generally purely qualitative.
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X mapping
Quantitative analysis and correction calculations
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